The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized  forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin  America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with  design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore  Digital Library. The best papers of the 18th LATS will be invited to re-submit to IEEE Design and Test of Computers,  Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE  (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design (TCAD).

Topics of interest include but are not limited to:

-Analog Mixed Signal Test
-Automatic Test Generation
-Built-In Self-Test
-Defect-Based Test
-Design and Synthesis for Testability
-Design for Electromagnetic Compatibility
-Design for Reliable Embedded Software
-Design Verification/Validation
-Economics of Test
-Fault Analysis and Diagnosis
-Fault Modeling and Simulation
-Fault-Tolerance in HW/SW
-Fault-Tolerant Architectures
-Memory Test and Repair
-On-Line Testing
-Process Control and Measurements
-Hardening Techniques
-Software Fault-Tolerance
-Software On-Line Testing
-System-on-Chip Test
-Test Resource Partitioning
-Yield Optimization
Hardware Security
Paper Submission Information:
To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results  at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper. PDF  electronic submissions must be done via the symposium‘s webpage:
Authors should send papers in the IEEE format. Detailed instructions are available at the symposium‘s webpage.  The Program Committee also welcomes proposals for panels and special topic sessions.
For additional information, please contact one of the Program Chairs:
Ernesto Sanchez – POLITO, Italy
Tiago Balen - Federal University of Rio Grande do Sul, Brazil
Submission Deadline (Title and Abstract): November 25th, 2016 December 16th, 2016
Submission HARD DEADLINE (Full paper): December 9th, 2016 December 23rd, 2016
Notification of Acceptance:  January 13th, 2017 January 22nd, 2016
Camera Ready: January 27th, 2017 February 3rd, 2016.

Bogotá, Colombia‘s administrative and political capital, was founded in 1538 in the Bogotá savanna at 2.600 m  of altitude. The city counts with the larger number of universities and research centers in the country; a rich set of  museums such as the Gold Museum including more than 30.000 pieces of tumbaga gold, and the Botero Museum  showing more than 100 artworks made by the known artist; in addition, the city offers a great variety of restaurants,  pubs, discos, shopping malls and coffee shops to delight its visitors. As an important business hub to Latin America,  the city is today recognized as an important and emerging business centre, and was included in the BestCities Global  Alliance.

2017 Workshop on Power Electronics and Power Quality Applications (PEPQA)
Dear colleagues,
We have the pleasure of inviting you to submit your technical research works for PEPQA 2017.
The 3rd International Workshop on Power Electronics and Power Quality Applications will be held on May 31 to ­ June 2, 2017, at Universidad de los Andes, Bogotá, Colombia.
This biannual workshop provides a space for students, academics, and industry professionals to collaborate on meeting the ever-increasing power electronics and power quality challenges in the Latin America region. The workshop covers a range of topics, including power electronics (PE) converters, adjustable speed drives, PE in transmission and distribution, power quality (PQ) analysis, PQ design and modeling, and simulation & education in PE/PQ.
Papers are peer-reviewed and selected on the basis of technical qualitytopic affinity, and applicability to the industry. Submissions are restricted to a minimum of four and a maximum of six pages, and English or Spanish will be considered for publication. It is important to highlight that, since the first edition, PEPQA's proceedings are indexed by IEEEXplore.
Full paper submission deadline: February 27, 2017
Acceptance notification: April 10, 2017
Camera-ready: April 28, 2017
Conference: May 31 – June 2, 2017
Click here for further details and submission
Details are reported in the call for papers available on the conference website
We will appreciate if you please share this message with your colleagues who are interested or involved in power electronics and power quality research.
Best regards,
PEPQA - Organizing Committee
Universidad de los Andes IAS SB Chapter
Bogotá, Colombia

Las ciudades son sistemas hiper-complejos que cada vez necesitan soluciones más innovadoras que marquen la diferencia y que sean construidas de manera sostenible, participativa y pública.
Por esto, lanzaremos el Ecosistema de Innovación Digital que se convertirá en un espacio de trabajo colaborativo en donde la ciencia, la ingeniería, el diseño, el arte, el emprendimiento y la computación convergen para dinamizar la generación de valor económico y social. Permitiendo a las tecnologías digitales convertirse en las herramientas que desarrollarán las ciudades del futuro.

Ingresa a  e inscribete en el evento más innovador de que IEEE Colombia y Alcaldía de Cali han diseñado para hacer del planeta un lugar más inteligente.

Minicoloquio EDS – Reunión de Capítulos EDS Sección Colombia
Auditorio PUJ Edificio 2 P700
Noviembre 15 de 2016


Estimados Miembros del IEEE, los invitamos a que nos acompañen a recibir al DVP del IEEE Computer Society Abraham Dávila, quien llega a Colombia para visitarnos en la ciudad de Cali, para hablar del "IEEE y la Importancia de la Ingeniería de Software".

La cita es hoy 26 de septiembre en la Universidad Santiago de Cali, de 3:30pm a 5:00pm, en el Hemiciclo Guillermo Coll Salazar, Bloque 7 Piso 5.

¡Los esperamos en este espacio abierto de Tertulia Informática para toda nuestra comunidad IEEE!