The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 18th LATS will be invited to re-submit to IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design (TCAD).
Topics of interest include but are not limited to:
-Analog Mixed Signal Test -Automatic Test Generation -Built-In Self-Test -Defect-Based Test -Design and Synthesis for Testability -Design for Electromagnetic Compatibility -Design for Reliable Embedded Software -Design Verification/Validation -Economics of Test -Fault Analysis and Diagnosis -Fault Modeling and Simulation -Fault-Tolerance in HW/SW -Fault-Tolerant Architectures -Memory Test and Repair -On-Line Testing -Process Control and Measurements -Radiation/EMI -Hardening Techniques -Software Fault-Tolerance -Software On-Line Testing -System-on-Chip Test -Test Resource Partitioning -Yield Optimization Hardware Security
Paper Submission Information:
To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper. PDF electronic submissions must be done via the symposium‘s webpage: www.lats.tttc-events.org
Authors should send papers in the IEEE format. Detailed instructions are available at the symposium‘s webpage. The Program Committee also welcomes proposals for panels and special topic sessions.
For additional information, please contact one of the Program Chairs:
Submission Deadline (Title and Abstract): November 25th, 2016 December 16th, 2016
Submission HARD DEADLINE (Full paper): December 9th, 2016 December 23rd, 2016
Notification of Acceptance: January 13th, 2017 January 22nd, 2016
Camera Ready: January 27th, 2017 February 3rd, 2016.
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